Draagbare, veelzijdige meterunit met compact ontwerp, zeer geschikt voor inspectie of voor gebruik in de productieruimte of het meetlaboratorium.
Meet ruwheidsparameters volgens ISO 4287: 1997 /
JIS B0601: 2001, DIN en ISO 12085: 1998 (MOTIF of CNOMO).
- Meetbereik: Ra 0-50µm; Rt 0,05µm - 200µm
- Cut-off lengte: 0,25 – 0,8 – 2,5 mm (acc. to ISO 4287)
1,5 – 2,5 – 4 – 8 – 12 – 16 mm (acc. to ISO 12085) - Taster SB51
- Basic TESA Data Studio software
- Bluetooth geïntegreerd
Ruwheidsmeter TESA TWIN SURF
Measured parameters Measured parameters according to ISO 4287: Ra – Rq – Rt – Rz – Rc - Rmax - RSm - RPc
Measured parameters according to ISO 12085: Pt – R – AR – Rx – PPc Additional measured parameters with TESA DATA-STUDIO Premium software (with licence):
Measured parameters according to ISO 4287: Rp – Rv – Rsk – Rku – RΔq – RΔa – Rmr rel – Rδc – Rmr(c) Pa - Pq - Pp – Pv – Pt – Pc – RPc - R3z Psk – Pku - PSm- PΔq - Pmr rel – Pδc – Pmr (c) Rk – Rpk – Rvk - A1 – A2 - Mr1 – Mr2
Measured parameters according to ISO 12085: Rke – Rpke – Rvke - A1e – A2e – Mr1e – Mr2e
Measuring range (Z)Ra 0 à 50 µm - Rt 0,05 à 200 µm
Total length (X)(number of cut-offs + 1) x Lc (maximum 17,5 mm) Traverse length (X)
Number of cut-offs x Lc
Filter λsΛc/ λs: 30 – 100 – 300 (acc. to ISO 3274)
Resolution 0,001 µm / 0,01 µinch
Cut-off length 0,25 – 0,8 – 2,5 mm (acc. to ISO 4287) 1,5 – 2,5 – 4 – 8 – 12 – 16 mm (acc. to ISO 12085)
Number of cut-offs 1 to 5
Electronic filter GAUSS according to ISO 11562
Maximum permissible error0,05 µm + (5 % R), R = roughness in µm
Diamond-like stylus R = 2 µm, 90°
Measuring force0,75 mN (acc. to ISO 3274)
Displacement speed0,5 – 1 mm/s (in measuring and positioning mode)
KeyboardThree-key tactile keyboard protected against dust particles and oil splashes IP67
Time until battery fully charged50 minutes
Power supply, battery USB-C charger Battery 2.4 V, 750 mAh, NiMh type
Main power supply 100–240 V, 50/60 Hz, maximum USB voltage 5 V Battery lifeUp to 300 measurements (depending on length of assessment)
Internal memory< 18,000 roughness parameters (with 0.8x5 length of assessment) or 30 measurements with graphical representation